A Novel Fault Diagnosis Method for Analog Circuits Based on Multi-Input Deep Residual Networks with an Improved Empirical Wavelet Transform

• Published in: Applied sciences Vol. 12; no. 3; p. 1675
• Main Authors: Liu, Zhen, Liu, Xuemei, Xie, Songlin, Wang, Junhai, Zhou, Xiuyun
• Format: Journal Article
• Language: English
• Published: Basel MDPI AG 01.02.2022
• Subjects: Accuracy; Algorithms; analog circuit; Artificial intelligence; circuit under test (CUT); Circuits; empirical wavelet transform (EWT); Fault diagnosis; Methods; multi-input deep residual network (ResNet); Neural networks; Simulation; Standard deviation; Support vector machines; Wavelet transforms

Analog circuits play an essential role in electronic systems. To strengthen the reliability of sophisticated electronic circuits, this paper proposes a novel analog circuit fault diagnosis method. Compared with traditional fault diagnosis, the fault diagnosis process in this paper uses a square wave...