A Novel Fault Diagnosis Method for Analog Circuits Based on Multi-Input Deep Residual Networks with an Improved Empirical Wavelet Transform - Liu, Zhen; Liu, Xuemei; Xie, Songlin; Wang, Junhai; Zhou, Xiuyun (Applied sciences, 2022)
Keywords: Accuracy; Algorithms; analog circuit; Artificial intelligence; circuit under test (CUT); Circuits; empirical wavelet transform (EWT); Fault diagnosis; Methods; multi-input deep residual network (ResNet); Neural networks; Simulation; Standard deviation; Support vector machines; Wavelet transforms