Reliability analysis of multi-trigger binary systems subject to competing failures

This paper suggests two combinatorial algorithms for the reliability analysis of multi-trigger binary systems subject to competing failure propagation and failure isolation effects. Propagated failure with global effect (PFGE) is referred to as a failure that not only causes outage to the component...

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Bibliographic Details
Published inReliability engineering & system safety Vol. 111; pp. 9 - 17
Main Authors Wang, Chaonan, Xing, Liudong, Levitin, Gregory
Format Journal Article
LanguageEnglish
Published Oxford Elsevier Ltd 01.03.2013
Elsevier
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