Recognition of overlapping elliptical objects in a binary image

• Published in: Pattern analysis and applications : PAA Vol. 24; no. 3; pp. 1193 - 1206
• Main Authors: Zou, Tong, Pan, Tianyu, Taylor, Michael, Stern, Hal
• Format: Journal Article
• Language: English
• Published: London Springer London 01.08.2021; Springer Nature B.V
• Subjects: Approximation; Clustering; Computer Science; Computer vision; Contours; Ellipses; Euclidean geometry; Identification methods; Image segmentation; Object recognition; Optimization; Pattern analysis; Pattern Recognition; Theoretical Advances; Integer programming; Segmentation; Contour; Ellipse fitting; Concave point; Rand index; Distance transform

Recognition of overlapping objects is required in many applications in the field of computer vision. Examples include cell segmentation, bubble detection and bloodstain pattern analysis. This paper presents a method to identify overlapping objects by approximating them with ellipses. The method is i...