Multi-scale study of the deformation mechanisms of thermoelectric p-type half-Heusler Hf0.44Zr0.44Ti0.12CoSb0.8Sn0.2 - Aumand, Matthieu; Amiard, Guillaume; He, Ran; Ren, Zhifeng; White, Ken W.; Thilly, Ludovic (Journal of applied physics, 2018)
Keywords: Applied physics; Back propagation; Bulk sampling; Compression tests; Confining; Crack propagation; Crack tips; Deformation analysis; Deformation mechanisms; Dislocations; Failure analysis; Failure mechanisms; Figure of merit; Fracture mechanics; Fracture toughness; Mesoscale phenomena; Metallurgy; Modulus of elasticity; Multiscale analysis; Nanoindentation; Stress propagation; Stress-strain curves; Stress-strain relationships; Thermoelectricity