Determination of layer morphology of rough layers in organic light emitting diodes by X‐ray reflectivity - Sachs, Ian; Fuhrmann, Marc; Deferme, Wim; Möbius, Hildegard (Engineering reports (Hoboken, N.J.), 2023)
Keywords: AFM; Aluminum; Anodes; Cathode sputtering; contrast enhancement; Density; Electrode materials; Electrons; Glass substrates; Indium tin oxides; Interfaces; Investigations; ITO spikes; OLED; Organic light emitting diodes; R&D; Reflectance; Research & development; Roughness; Sensitivity enhancement; Silicon wafers; Smoothing; Thickness; Thin films; Topography; X-rays; x‐ray reflection