APA (7th ed.) Citation

Sachs, I., Fuhrmann, M., Deferme, W., & Möbius, H. (2023). Determination of layer morphology of rough layers in organic light emitting diodes by X‐ray reflectivity. Engineering reports (Hoboken, N.J.), 5(4), -n/a. https://doi.org/10.1002/eng2.12594

Chicago Style (17th ed.) Citation

Sachs, Ian, Marc Fuhrmann, Wim Deferme, and Hildegard Möbius. "Determination of Layer Morphology of Rough Layers in Organic Light Emitting Diodes by X‐ray Reflectivity." Engineering Reports (Hoboken, N.J.) 5, no. 4 (2023): -n/a. https://doi.org/10.1002/eng2.12594.

MLA (9th ed.) Citation

Sachs, Ian, et al. "Determination of Layer Morphology of Rough Layers in Organic Light Emitting Diodes by X‐ray Reflectivity." Engineering Reports (Hoboken, N.J.), vol. 5, no. 4, 2023, pp. -n/a, https://doi.org/10.1002/eng2.12594.