Machine vision inspection of early failure and line-shaped defects of blue InGaN/GaN light emitting diodes soaked in liquid nitrogen for cryogenic tests

• Published in: Results in physics Vol. 50; p. 106594
• Main Authors: Yang, Chun-Yen, Yu, Chih-Yuan, Lin, You-Li, Hon, Mou-Tuong, Yang, Shao-Jui, Zhang, Yi-Zong, Kang, Hsuan-Chia, Kuo, Yaw-Wen, Lin, Chia-Feng, Wu, You-Lin, Chou, Hsin-Hung, Chen, Hsiang, Li, Yung-Hui, Han, Jung
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.07.2023; Elsevier
• Subjects: InGaN/GaN blue LED; Lattice deformation; Line defects; Liquid nitrogen; Machine vision; InGaN/GaN blue LED; Machine vision; Line defects; Lattice deformation; Liquid nitrogen

•Cryogenic tests reveal spectral shifts in LEDs.•Line-shaped defects appear on GaN LED surface.•Machine vision detects early areas of degradation.•Reliability studies show promise for Space and Arctic applications. Cryogenic tests were conducted on blue InGaN/GaN light-emitting diodes (LEDs) by imme...