APA (7th ed.) Citation

Yang, X., Lo, D., Xia, X., & Sun, J. (2017). TLEL: A two-layer ensemble learning approach for just-in-time defect prediction. Information and software technology, 87, 206-220. https://doi.org/10.1016/j.infsof.2017.03.007

Chicago Style (17th ed.) Citation

Yang, Xinli, David Lo, Xin Xia, and Jianling Sun. "TLEL: A Two-layer Ensemble Learning Approach for Just-in-time Defect Prediction." Information and Software Technology 87 (2017): 206-220. https://doi.org/10.1016/j.infsof.2017.03.007.

MLA (9th ed.) Citation

Yang, Xinli, et al. "TLEL: A Two-layer Ensemble Learning Approach for Just-in-time Defect Prediction." Information and Software Technology, vol. 87, 2017, pp. 206-220, https://doi.org/10.1016/j.infsof.2017.03.007.