Overview of Real-Time Lifetime Prediction and Extension for SiC Power Converters - Ni, Ze; Lyu, Xiaofeng; Yadav, Om Prakash; Singh, Brij N.; Zheng, Sheng; Cao, Dong (IEEE transactions on power electronics, 2020)
Keywords: Accelerated lifetime test (ALT); Accelerated tests; active thermal control; ageing indicator; Analytical models; Commercialization; Condition monitoring; Electric vehicles; Electronic devices; Energy conversion efficiency; failure mode; Failure modes; lifetime control; lifetime modeling; Mechanical engineering; Monitoring; MOSFET; Power converters; Real time; Reliability; Reliability engineering; remaining useful lifetime (RUL); Service life assessment; Silicon carbide; silicon carbide (SiC) mosfet; Software; Software development tools; Statistical models; Temperature measurement; Temperature sensors; temperature-sensitive electrical parameter (TSEP)