Hot-electron relaxation in ZnO films

• Published in: Thin solid films Vol. 519; no. 10; pp. 3421 - 3424
• Main Authors: Yang, M.D., Wu, S.W., Tong, S.C., Shu, G.W., Liu, Y.W., Shen, J.L., Lan, S.M., Wu, C.H., Huang, Y.H., Yang, T.N.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.03.2011; Elsevier
• Subjects: Acoustic emission; Acoustics; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Electron temperature; Emission; Exact sciences and technology; Hot electrons; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Optical properties of specific thin films; Phonon; Phonons; Photoluminescence; Physics; Thin films; Zinc oxide; ZnO films; ZnO films; Photoluminescence; Phonon; Thin films; Optical phonons; Relaxation; Electron temperature; Hot electrons; High energy; Electric field effects; Optical properties; Zinc oxide; Energy losses
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/j.tsf.2010.12.232

The energy relaxation of hot electrons in ZnO films was investigated by the electric-field-dependent photoluminescence. From the high-energy tail of photoluminescence, the electron temperature of the hot electrons in ZnO was determined. Longitudinal optical phonon emission alone cannot explain the relationship between the electron temperature and the electron energy loss rate. Instead, it can be explained by a model based on a combination of both the acoustic and longitudinal optical phonon emissions.