Dynamic on-State Resistance Test and Evaluation of GaN Power Devices Under Hard- and Soft-Switching Conditions by Double and Multiple Pulses - Li, Rui; Wu, Xinke; Yang, Shu; Sheng, Kuang (IEEE transactions on power electronics, 2019)
Keywords: Computer simulation; Converters; Current collapse; Current measurement; dynamic on -state resistance; Electric potential; Electronic devices; Energy conversion; Gallium nitride; GaN devices; hard switching; Logic gates; Soft switching; Switches; Switching; Voltage measurement; Zero voltage switching