A 10 nA Ultra-Low Quiescent Current and 60 ns Fast Transient Response Low-Dropout Regulator for Internet-of-Things
Ultra-low quiescent current (<inline-formula> <tex-math notation="LaTeX">I_{Q} </tex-math></inline-formula>) low-dropout regulator is the only solution for compact size Internet of Things (IoT) electronic devices. This paper presents an ultra-low <inline-formula&...
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Published in | IEEE transactions on circuits and systems. I, Regular papers Vol. 69; no. 1; pp. 139 - 147 |
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Main Authors | , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.01.2022
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | Ultra-low quiescent current (<inline-formula> <tex-math notation="LaTeX">I_{Q} </tex-math></inline-formula>) low-dropout regulator is the only solution for compact size Internet of Things (IoT) electronic devices. This paper presents an ultra-low <inline-formula> <tex-math notation="LaTeX">I_{Q} </tex-math></inline-formula> low dropout regulator, including low <inline-formula> <tex-math notation="LaTeX">I_{Q} </tex-math></inline-formula> error amplifier (EA) compensated by the adaptive current control (ACC), low leakage feedback network, low <inline-formula> <tex-math notation="LaTeX">I_{Q} </tex-math></inline-formula> current comparator, analog transient enhancement (ATE), and digital transient enhancement (DTE). The chip was fabricated in a standard <inline-formula> <tex-math notation="LaTeX">0.5~\mu \text{m} </tex-math></inline-formula> CMOS process. Measurement results show the current peak efficiency of the LDO is as high as 99.99%. Besides, owing to ATE and DTE circuits, when the load current changes from 1mA to 50mA with a 10 ns edge time, the measured undershoot and overshoot voltages are 75 mV and 50 mV, respectively, with the recovery time (<inline-formula> <tex-math notation="LaTeX">T_{R} </tex-math></inline-formula>) of 60 ns and 80 ns, respectively, where the best 0.003 ps FoM is achieved. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
ISSN: | 1549-8328 1558-0806 |
DOI: | 10.1109/TCSI.2021.3093057 |