Evaluation of nanostructure and properties of aluminum phthalocyanine chloride thin films due to ethanol-vapor treatment
Aluminum phthalocyanine chloride (AlClPc) thin films were evaporated and the properties of the AlClPc thin films treated with ethanol vapor were investigated using attenuated total reflection (ATR) and emission light measurements due to surface plasmon (SP) excitations. The optical absorption spectr...
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Published in | Thin solid films Vol. 499; no. 1; pp. 174 - 178 |
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Main Authors | , , , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
Lausanne
Elsevier B.V
21.03.2006
Elsevier Science |
Subjects | |
Online Access | Get full text |
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Summary: | Aluminum phthalocyanine chloride (AlClPc) thin films were evaporated and the properties of the AlClPc thin films treated with ethanol vapor were investigated using attenuated total reflection (ATR) and emission light measurements due to surface plasmon (SP) excitations. The optical absorption spectra and surface morphology remarkably changed due to the ethanol-vapor treatment. From the ATR measurement, it was found that the thickness evaluated from the theoretical calculations increases with the treatment of ethanol vapor. The emission lights due to SP were also observed for the samples. The emission light intensity increase with the surface roughness for the incident light with wavelength of 488.0 nm. The current vs. voltage characteristics of the AlClPc thin films before and after the ethanol-vapor treatment were also investigated and it was found that the conduction current was increased by the ethanol-vapor treatment. |
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Bibliography: | SourceType-Scholarly Journals-2 ObjectType-Feature-2 ObjectType-Conference Paper-1 content type line 23 SourceType-Conference Papers & Proceedings-1 ObjectType-Article-3 |
ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/j.tsf.2005.07.022 |