Characteristic variation of superconducting thin films modified by an atomic force microscope

Superconducting thin film surfaces were modified in order to test a possibility as a channel of superconducting flux flow transistor (SFFT) by AFM lithography. A conventional lithography method has been employed for superconducting strips which were patterned on LaAlO3 substrates. A region of the st...

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Bibliographic Details
Published inPhysica status solidi. C Vol. 2; no. 5; pp. 1692 - 1696
Main Authors Kang, Hyeong-Gon, Ko, Seokcheol, Jahng, Kwang-Yeop, Lee, Haeseong
Format Journal Article
LanguageEnglish
Published Weinheim WILEY-VCH Verlag 01.03.2005
WILEY‐VCH Verlag
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