Computer-assisted analysis of TEM diffraction contrast images of (In,Ga)N/GaN nanostructures

• Published in: Physica status solidi. C Vol. 5; no. 12; pp. 3732 - 3735
• Main Authors: Manolaki, P., Häusler, I., Kirmse, H., Mogilatenko, A., Neumann, W., Smałc-Koziorowska, J., Skierbiszewski, C.
• Format: Journal Article
• Language: English
• Published: Berlin WILEY-VCH Verlag 01.12.2008; WILEY‐VCH Verlag
• Subjects: 68.37.Lp; 68.65.Fg

III‐nitride semiconductor nanostructures are subject of intense studies with respect to their optoelectronic, structural and chemical properties. Important parameters for the wavelength of the emitted light are the chemical composition and the dimensionality of the nanostructures. Transmission elect...