One-Volt, Solution-Processed InZnO Thin-Film Transistors - Cai, Wensi; Li, Haiyun; Zang, Zhigang (IEEE electron device letters, 2021)
Keywords: Annealing; indium-zinc-oxide (IZO); Logic gates; one-volt operation; Performance evaluation; Semiconductor devices; Solution-processed; Surface morphology; Temperature measurement; Thin film transistors; thin-film transistors (TFTs)