APA (7th ed.) Citation

Mori, D., Nakata, I., Matsuda, M., & Sato, S. (2021). Detailing Influence of Contact Condition and Island Edge on Dual-Configuration Kelvin Pseudo-MOSFET Method. IEEE transactions on electron devices, 68(6), 2906-2911. https://doi.org/10.1109/TED.2021.3074115

Chicago Style (17th ed.) Citation

Mori, Daigo, Iori Nakata, Masayoshi Matsuda, and Shingo Sato. "Detailing Influence of Contact Condition and Island Edge on Dual-Configuration Kelvin Pseudo-MOSFET Method." IEEE Transactions on Electron Devices 68, no. 6 (2021): 2906-2911. https://doi.org/10.1109/TED.2021.3074115.

MLA (9th ed.) Citation

Mori, Daigo, et al. "Detailing Influence of Contact Condition and Island Edge on Dual-Configuration Kelvin Pseudo-MOSFET Method." IEEE Transactions on Electron Devices, vol. 68, no. 6, 2021, pp. 2906-2911, https://doi.org/10.1109/TED.2021.3074115.