PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration - Kim, Moo-Young; Lee, Hokyu; Kim, Chulwoo (IEEE transactions on very large scale integration (VLSI) systems, 2012)
Keywords: All digital gates; and temperature (PVT) detector; Applied sciences; Arrays; Clocks; CMOS; current source; Current sources; Delay; Design. Technologies. Operation analysis. Testing; Detectors; Digital; Electric potential; Electrical engineering. Electrical power engineering; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics; Electronics; Errors; Exact sciences and technology; General equipment and techniques; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Integrated circuits; MOS devices; on-chip; Physics; Power demand; Power electronics, power supplies; process; Resistors; self-calibration; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing; supply voltage; Very large scale integration; Voltage; Current source; process; and temperature (PVT) detector; Measurement sensor; self-calibration; Temperature sensor; Power supply; Power electronics; on-chip; All digital gates; Implementation; Selfcalibration; Complementary MOS technology; Electric power consumption; supply voltage; NMOS technology