Influence of film thickness on structural, optical, and electrical properties of sputtered nickel oxide thin films - Rezaee, Sahar; Korpi, Alireza Grayeli; Karimi, Maryam; Jurečka, Stanislav; Arman, Ali; Luna, Carlos; Ţălu, Ştefan (Microscopy research and technique, 2024)
Keywords: AFM; Atomic force microscopy; Crystal defects; Crystal structure; Crystallites; Crystals; Electrical properties; Film thickness; Graphical representations; Lattice vacancies; Magnetic properties; Magnetron sputtering; Morphology; Nickel; Nickel oxides; NiO thin films; Optical properties; Refractivity; RF magnetron sputtering; Spectroscopy; Substrates; Surface analysis (chemical); Surface properties; Surface roughness; Thin films; Two dimensional analysis; X-ray diffraction; XRD; RF magnetron sputtering; AFM; optical properties; XRD; NiO thin films