APA (7th ed.) Citation

Rezaee, S., Korpi, A. G., Karimi, M., Jurečka, S., Arman, A., Luna, C., & Ţălu, Ş. (2024). Influence of film thickness on structural, optical, and electrical properties of sputtered nickel oxide thin films. Microscopy research and technique, 87(7), 1402-1412. https://doi.org/10.1002/jemt.24530

Chicago Style (17th ed.) Citation

Rezaee, Sahar, Alireza Grayeli Korpi, Maryam Karimi, Stanislav Jurečka, Ali Arman, Carlos Luna, and Ştefan Ţălu. "Influence of Film Thickness on Structural, Optical, and Electrical Properties of Sputtered Nickel Oxide Thin Films." Microscopy Research and Technique 87, no. 7 (2024): 1402-1412. https://doi.org/10.1002/jemt.24530.

MLA (9th ed.) Citation

Rezaee, Sahar, et al. "Influence of Film Thickness on Structural, Optical, and Electrical Properties of Sputtered Nickel Oxide Thin Films." Microscopy Research and Technique, vol. 87, no. 7, 2024, pp. 1402-1412, https://doi.org/10.1002/jemt.24530.