APA (7th ed.) Citation

Fang, Q., de Haart, U., Schäfer, D., Thaler, F., Rangel-Hernandez, V., Peters, R., & Blum, L. (2020). Degradation Analysis of an SOFC Short Stack Subject to 10,000 h of Operation. Journal of the Electrochemical Society, 167(14), 144508-144517. https://doi.org/10.1149/1945-7111/abc843

Chicago Style (17th ed.) Citation

Fang, Qingping, Ute de Haart, Dominik Schäfer, Florian Thaler, Victor Rangel-Hernandez, Roland Peters, and Ludger Blum. "Degradation Analysis of an SOFC Short Stack Subject to 10,000 H of Operation." Journal of the Electrochemical Society 167, no. 14 (2020): 144508-144517. https://doi.org/10.1149/1945-7111/abc843.

MLA (9th ed.) Citation

Fang, Qingping, et al. "Degradation Analysis of an SOFC Short Stack Subject to 10,000 H of Operation." Journal of the Electrochemical Society, vol. 167, no. 14, 2020, pp. 144508-144517, https://doi.org/10.1149/1945-7111/abc843.