Single-charge effects in silicon nanocrystals probed by atomic force microscopy: From charge blinking to nanocrystal charging

• Published in: Journal of applied physics Vol. 130; no. 6
• Main Authors: Mélin, Thierry, Deresmes, Dominique
• Format: Journal Article
• Language: English
• Published: Melville American Institute of Physics 14.08.2021
• Subjects: Applied physics; Atomic force microscopy; Blinking; Charging; Condensed Matter; Electrical properties; Engineering Sciences; Materials Science; Micro and nanotechnologies; Microelectronics; Microscopes; Microscopy; Nanocrystals; Physics; Sensitivity; Silicon; Topography; Atomic force microscopy; Charge fluctuations; Nanocrystals; Electrical properties and parameters; Electrostatics

We investigate the electrical properties of individual silicon nanocrystals (NCs) by means of atomic/electrostatic force microscopy at atmospheric pressure, with the sensitivity of the elementary charge. Using a tip bias close to the sample surface potential for the sample topography imaging, NCs re...