Singular Frequencies in Rectangular Fluctuations in the IEC Flickermeter

• Published in: IEEE transactions on power delivery Vol. 22; no. 2; pp. 1255 - 1256
• Main Authors: Ruiz, J., Gutierrez, J.J., Irusta, U.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.04.2007; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Analysis of variance; Applied sciences; Blocking; Cutoff frequency; Demodulation; Discontinuity; Disturbances. Regulation. Protection; Electric potential; Electrical engineering. Electrical power engineering; Electrical power engineering; Estimators; Europe; Exact sciences and technology; Fluctuation; Frequency estimation; IEC flickermeter; IEC standards; Low pass filters; Mathematical model; Nonlinearity; P_{\rm st}=1 curve; Power harmonic filters; Power networks and lines; rectangular fluctuations; Variance; Voltage; Voltage fluctuations; Performance evaluation; Singularity; Flickermeter; Non linear model; Pst = 1 curve; IEC flickermeter; Power system stability; Voltage stability; IEC standard; rectangular fluctuations; Voltage fluctuation

A detailed observation of the IEC flickermeter subject to rectangular voltage fluctuations indicates the presence of small discontinuities for a set of fluctuation frequencies. These discontinuities are not observed in the real lamp-eye-brain model. This work provides the theoretical framework for t...