Interlayer Thickness, Transition Parameter, and Intergranular Exchange in Perpendicular Oxide Media

• Published in: IEEE transactions on magnetics Vol. 42; no. 10; pp. 2333 - 2335
• Main Authors: Supper, N., Margulies, D.T., Olson, T., Ikeda, Y., Moser, A., Lengsfield, B., Berger, A.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01.10.2006; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Cross-disciplinary physics: materials science; rheology; Density measurement; Deposition; Disk recording; Elementary particle exchange interactions; Exact sciences and technology; Filling; Hard disks; Intergranular exchange; interlayer (IL) thickness; Interlayers; Magnetic field measurement; Magnetic heads; Magnetic recording; Magnetism; Materials science; Mathematical models; Media; Other topics in materials science; Oxides; Perpendicular magnetic recording; perpendicular oxide media; Physics; Recording; Reduction; Saturation magnetization; transition parameter; Interfacial layer; Thickness; Proceedings; perpendicular oxide media; Intergranular exchange; interlayer (IL) thickness; transition parameter; Magnetic recording; Magnetic properties

The effect of intergranular exchange on the transition parameter (a) in perpendicular oxide composite media was investigated. Two different methods were used to vary the amount of intergranular exchange present in the films. The inter layer (IL) thickness was varied for one series of sample, while f...