Disc defect classification for optical disc drives

• Published in: IEEE transactions on consumer electronics Vol. 51; no. 3; pp. 856 - 863
• Main Authors: van Helvoirt, J., Leenknegt, G.A.L., Steinbuch, M., Goosens, H.J.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.08.2005; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Classification; Clustering; Control systems; Defects; Discs; Disks; Drives; Fault detection; Faults; Manufacturing processes; On-line systems; Optical beams; Optical discs; Optical distortion; Power distribution; Power system protection; Surface contamination; Testing

Optical disc drives are subject to various disturbances and faults. A special type of fault is the so-called disc defect. In this paper we present an approach for disc defect classification. It is based on hierarchical clustering of measured signals that are affected by disc defects. The time-series...