Disc defect classification for optical disc drives

Optical disc drives are subject to various disturbances and faults. A special type of fault is the so-called disc defect. In this paper we present an approach for disc defect classification. It is based on hierarchical clustering of measured signals that are affected by disc defects. The time-series...

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Bibliographic Details
Published inIEEE transactions on consumer electronics Vol. 51; no. 3; pp. 856 - 863
Main Authors van Helvoirt, J., Leenknegt, G.A.L., Steinbuch, M., Goosens, H.J.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.08.2005
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Classification
Clustering
Control systems
Defects
Discs
Disks
Drives
Fault detection
Faults
Manufacturing processes
On-line systems
Optical beams
Optical discs
Optical distortion
Power distribution
Power system protection
Surface contamination
Testing
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Summary:Optical disc drives are subject to various disturbances and faults. A special type of fault is the so-called disc defect. In this paper we present an approach for disc defect classification. It is based on hierarchical clustering of measured signals that are affected by disc defects. The time-series are mapped into a feature space after which the feature vectors are clustered in a hierarchical fashion. Finally, signals are fitted onto the clusters to obtain single representations for each fault class. The resulting class descriptions can then be used for (on-line) classification of new disc defects. The approach is evaluated by applying it to a set of test data.
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ISSN:0098-3063
1558-4127
DOI:10.1109/TCE.2005.1510495