Lithiation of the crystalline silicon as analyzed using soft X-ray emission spectroscopy and windowless energy dispersive X-ray spectroscopy

• Published in: Applied surface science Vol. 569; p. 151040
• Main Authors: Lin, Huiwen, Uosaki, Kohei, Noguchi, Hidenori
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 15.12.2021
• Subjects: Diffusion-controlled growth; Lithiation; Si anode; Soft X-ray emission spectroscopy; Windowless energy dispersive X-ray spectroscopy; Diffusion-controlled growth; Soft X-ray emission spectroscopy; Lithiation; Si anode; Windowless energy dispersive X-ray spectroscopy

[Display omitted] •The Si lithiation starts from a-Li13Si4 formation and its conversion to c-Li15Si4.•The c-Li15Si4 forms at the outermost layer along with innermost Li-diffused LixSi.•The formation of a-Li13Si4 stops at a specific time when covering the Si surface.•Si lithiation is found to be a di...