Yi, L., Siedler, C., Kinkel, Y., Glatt, M., Kölsch, P., & Aurich, J. C. (2021). Object detection in factory based on deep learning approach. Procedia CIRP, 104, 1029-1034. https://doi.org/10.1016/j.procir.2021.11.173
Chicago Style (17th ed.) CitationYi, Li, Carina Siedler, Yann Kinkel, Moritz Glatt, Patrick Kölsch, and Jan C. Aurich. "Object Detection in Factory Based on Deep Learning Approach." Procedia CIRP 104 (2021): 1029-1034. https://doi.org/10.1016/j.procir.2021.11.173.
MLA (9th ed.) CitationYi, Li, et al. "Object Detection in Factory Based on Deep Learning Approach." Procedia CIRP, vol. 104, 2021, pp. 1029-1034, https://doi.org/10.1016/j.procir.2021.11.173.
Warning: These citations may not always be 100% accurate.