Uncertainty of S-Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard - Koo, Hyunji; Salter, Martin; Kang, No-Weon; Ridler, Nick; Hong, Young-Pyo (Journal of Electromagnetic Engineering and Science, 2021)
Keywords: 전자/정보통신공학; SParameter Uncertainty; Monte Carlo; Stripline; Characteristic Impedance; Impedance Renormalization; Printed Circuit Board (PCB); TRL Calibration; Line Standard