Micro Characterization and Imaging of Spikes in Nickel Plated Solar Cells

• Published in: Energy procedia Vol. 55; pp. 624 - 632
• Main Authors: Büchler, Andreas, Kluska, Sven, Brand, Andreas, Geisler, Christian, Hopman, Sybille, Glatthaar, Markus
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 2014
• Subjects: laser ablation; nickel plating; nickel silicide; ReBEL; selective emitter; nickel plating; laser ablation; ReBEL; selective emitter; nickel silicide

Annealing induced silicidation of plated nickel contacts can severly lower the solar cell performance due to deep nickel silicide spikes penetrating the space charge region. This work summarizes several attempts to characterize performance limiting deep silicide structures and determines the influen...