Power-optimal simultaneous buffer insertion/sizing and wire sizing for two-pin nets
This paper studies the problems of optimizing power dissipation for simultaneous buffer insertion/sizing and uniform wire sizing (BISUWS), and simultaneous buffer insertion/sizing and tapered wire sizing (BISTWS). For BISUWS, we analyze the optimal total power dissipation under the delay constraints...
Saved in:
Published in | IEEE transactions on computer-aided design of integrated circuits and systems Vol. 24; no. 12; pp. 1915 - 1924 |
---|---|
Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.12.2005
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | This paper studies the problems of optimizing power dissipation for simultaneous buffer insertion/sizing and uniform wire sizing (BISUWS), and simultaneous buffer insertion/sizing and tapered wire sizing (BISTWS). For BISUWS, we analyze the optimal total power dissipation under the delay constraints as well as the power-delay tradeoff. For BISTWS, we study the problems of minimizing power dissipation with optimal delay constraints or with a given delay penalty. We derive optimal solutions for both cases. These solutions can be used to efficiently estimate the power dissipation for long single wires in the interconnect designs. |
---|---|
AbstractList | This paper studies the problems of optimizing power dissipation for simultaneous buffer insertion/sizing and uniform wire sizing (BISUWS), and simultaneous buffer insertion/sizing and tapered wire sizing (BISTWS). For BISUWS, we analyze the optimal total power dissipation under the delay constraints as well as the power-delay tradeoff. For BISTWS, we study the problems of minimizing power dissipation with optimal delay constraints or with a given delay penalty. We derive optimal solutions for both cases. These solutions can be used to efficiently estimate the power dissipation for long single wires in the interconnect designs. |
Author | Jin Liu Ruiming Li Xuan Zeng Dian Zhou |
Author_xml | – sequence: 1 givenname: Ruiming surname: Li fullname: Li, Ruiming – sequence: 2 givenname: Dian surname: Zhou fullname: Zhou, Dian – sequence: 3 givenname: Jin surname: Liu fullname: Liu, Jin – sequence: 4 givenname: Xuan surname: Zeng fullname: Zeng, Xuan |
BookMark | eNqNkU1Lw0AQhhdRsK3eBS_Bg7e0s1_Z5FjqJwgK6nnZxFnZku7W3YSiv96UCIInT8PA8w4z80zJoQ8eCTmjMKcUqsXLank1ZwByXkpWKHZAJrTiKhdU0kMyAabKHEDBMZmmtAagQrJqQp6fwg5jHrad25g2S27Tt53xGPqU1b21GDPnE8bOBb9I7sv598z4t2znImY_vQ0x63Yh3zqfeezSCTmypk14-lNn5PXm-mV1lz883t6vlg95wyXr8sIai8Drwip4s7SoWS0aK6ihRholuKJMIDVFU5Y1VrVg3FZFw6CAGqCSjM_I5Th3G8NHj6nTG5cabNtxf80qKbgo_wGWoKRQcgAv_oDr0Ec_HKHLkgvOmFADBCPUxJBSRKu3cXhe_NQU9N6F3rvQexd6dDFEzseIQ8RfXIphoOTf_82G7Q |
CODEN | ITCSDI |
CitedBy_id | crossref_primary_10_3906_elk_1411_129 crossref_primary_10_3724_SP_J_1146_2010_01114 |
Cites_doi | 10.1109/T-ED.1985.22046 10.1145/267665.267712 10.1109/TED.2002.804706 10.1109/82.673643 10.1109/DAC.1997.597214 10.1145/383251.383256 10.1016/S0167-9260(96)00008-9 10.1145/267665.267711 10.1109/ASIC.2001.954689 10.1109/EDTC.1996.494153 10.1109/43.905678 10.1109/ICCAD.1997.643579 10.1109/43.766728 10.1109/4.65707 10.1063/1.1697872 10.1109/43.97624 10.1109/ICCAD.1993.580152 10.1109/5.920581 10.1109/ICCAD.1995.480004 10.1007/978-1-4615-2325-3_3 |
ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005 |
DBID | 97E RIA RIE AAYXX CITATION 7SC 7SP 8FD JQ2 L7M L~C L~D 7TB FR3 |
DOI | 10.1109/TCAD.2005.852672 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005-present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef Computer and Information Systems Abstracts Electronics & Communications Abstracts Technology Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional Mechanical & Transportation Engineering Abstracts Engineering Research Database |
DatabaseTitle | CrossRef Technology Research Database Computer and Information Systems Abstracts – Academic Electronics & Communications Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Professional Mechanical & Transportation Engineering Abstracts Engineering Research Database |
DatabaseTitleList | Technology Research Database Technology Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 1937-4151 |
EndPage | 1924 |
ExternalDocumentID | 2425555671 10_1109_TCAD_2005_852672 1542245 |
Genre | orig-research |
GroupedDBID | --Z -~X 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AASAJ ABQJQ ABVLG ACGFS ACIWK ACNCT AENEX AETIX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD HZ~ H~9 IBMZZ ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P PZZ RIA RIE RIG RNS TN5 VH1 VJK XFK AAYXX CITATION 7SC 7SP 8FD JQ2 L7M L~C L~D 7TB FR3 |
ID | FETCH-LOGICAL-c352t-6fafe03b6f70df16b2b4cf41a1a5a7437124e1a6c88be9b423f96c2060b009523 |
IEDL.DBID | RIE |
ISSN | 0278-0070 |
IngestDate | Sat Aug 17 02:14:13 EDT 2024 Fri Aug 16 14:00:08 EDT 2024 Thu Oct 10 16:33:00 EDT 2024 Fri Aug 23 02:53:52 EDT 2024 Wed Jun 26 19:20:38 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 12 |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c352t-6fafe03b6f70df16b2b4cf41a1a5a7437124e1a6c88be9b423f96c2060b009523 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
PQID | 883432247 |
PQPubID | 23500 |
PageCount | 10 |
ParticipantIDs | proquest_journals_883432247 proquest_miscellaneous_28075475 crossref_primary_10_1109_TCAD_2005_852672 proquest_miscellaneous_29543482 ieee_primary_1542245 |
PublicationCentury | 2000 |
PublicationDate | 2005-Dec. 2005-12-00 20051201 |
PublicationDateYYYYMMDD | 2005-12-01 |
PublicationDate_xml | – month: 12 year: 2005 text: 2005-Dec. |
PublicationDecade | 2000 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York |
PublicationTitle | IEEE transactions on computer-aided design of integrated circuits and systems |
PublicationTitleAbbrev | TCAD |
PublicationYear | 2005 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref13 ref12 ref15 ref14 nekili (ref16) 1993 ref20 ref11 ref22 ref10 ref21 ref2 (ref23) 1999 ref17 ref19 ref18 ref8 ref7 bakoglu (ref1) 1990 ref9 ref4 ref3 ref6 ref5 rabaey (ref24) 1996 |
References_xml | – ident: ref2 doi: 10.1109/T-ED.1985.22046 – ident: ref7 doi: 10.1145/267665.267712 – ident: ref5 doi: 10.1109/TED.2002.804706 – ident: ref20 doi: 10.1109/82.673643 – year: 1990 ident: ref1 publication-title: Circuits Interconnections and Packaging for VLSI contributor: fullname: bakoglu – ident: ref4 doi: 10.1109/DAC.1997.597214 – ident: ref9 doi: 10.1145/383251.383256 – ident: ref12 doi: 10.1016/S0167-9260(96)00008-9 – start-page: 2023 year: 1993 ident: ref16 publication-title: Proc IEEE Int Symp Circuits and Systems contributor: fullname: nekili – ident: ref21 doi: 10.1145/267665.267711 – ident: ref19 doi: 10.1109/ASIC.2001.954689 – ident: ref18 doi: 10.1109/EDTC.1996.494153 – year: 1999 ident: ref23 publication-title: International Technology Roadmap for Semiconductors (ITRS) – ident: ref3 doi: 10.1109/43.905678 – year: 1996 ident: ref24 publication-title: Digital Integrated Circuits A Design Perspective contributor: fullname: rabaey – ident: ref13 doi: 10.1109/ICCAD.1997.643579 – ident: ref8 doi: 10.1109/43.766728 – ident: ref14 doi: 10.1109/4.65707 – ident: ref15 doi: 10.1063/1.1697872 – ident: ref22 doi: 10.1109/43.97624 – ident: ref10 doi: 10.1109/ICCAD.1993.580152 – ident: ref11 doi: 10.1109/5.920581 – ident: ref17 doi: 10.1109/ICCAD.1995.480004 – ident: ref6 doi: 10.1007/978-1-4615-2325-3_3 |
SSID | ssj0014529 |
Score | 1.8162946 |
Snippet | This paper studies the problems of optimizing power dissipation for simultaneous buffer insertion/sizing and uniform wire sizing (BISUWS), and simultaneous... |
SourceID | proquest crossref ieee |
SourceType | Aggregation Database Publisher |
StartPage | 1915 |
SubjectTerms | Application specific integrated circuits Buffer insertion Delay effects Digital integrated circuits Educational technology Integrated circuit interconnections Laboratories power Power dissipation Research and development simultaneous buffer insertion/sizing and wire sizing Very large scale integration Wire wire sizing |
Title | Power-optimal simultaneous buffer insertion/sizing and wire sizing for two-pin nets |
URI | https://ieeexplore.ieee.org/document/1542245 https://www.proquest.com/docview/883432247 https://search.proquest.com/docview/28075475 https://search.proquest.com/docview/29543482 |
Volume | 24 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3BTtwwEB0Bp3JoC7Tqlpb6wAUJ7yaO7cTHqipClUCVAIlbZCe2tEIkK5IIia_vTLy7UIpQb4niKM6M7Xn2zLwBOMxDUgRtC65qI7nMRODGpikPwghvEwQMNeUOn53r0yv561pdb8DxOhfGez8Gn_kpXY6-_LqtBjoqm6G5R4ujNmEzNybmaq09BuRAHM9TiDEWx_HKJZmY2SX-VDw9KZTQufjLBI01Vf5ZiEfrcvIOzlb9ikElN9Ohd9Pq4Rll4_92_D28XcJM9j2Oix3Y8M0ubD8hH9yDi99UII23uGbcYtNuTrGFtvHt0DE3UNkUNm_IV4-am3XzB3yJ2aZmRG7MlveIeFl_3_LFvGGN77sPcHXy8_LHKV-WWOAVIq-e62CDTzKnQ57UIdVOOFkFmdrUKovgIkfz71Orq6Jw3jjEXsHoSiQ6cQTORPYRtpq28Z-AOSvSzKZZXVVKZt6ZzEjcXeIUD0bVuZjA0Urq5SIyaZTjDiQxJWmICmKqMmpoAnskxMd2UX4T2F-pqVxOta4sCsqNFTKfwLf1U5wj5PiIQiuJ8UfJXL3SwlCKbSE-v_zhfXgTKVspjOULbPV3g_-KYKR3B-Mo_AMHaNxG |
link.rule.ids | 315,783,787,799,27936,27937,55086 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Nb9QwEB2VcoAeWqAglgLNgQsS3k0c27GPFWq1QLdCYiv1FtmJLa0qkookqtRfz0y8u3wKcUsUR3FmbM-zZ-YNwJsipDooq5msjWAi54EZm2UscMO9TREw1JQ7vLhQ80vx8Upe7cC7bS6M934MPvNTuhx9-XVbDXRUNkNzjxZH3oP7iKu1itlaW58BuRDHExXijMWRvHFKpma2xN-K5ydaclXwX4zQWFXlj6V4tC9nB7DY9CyGlVxPh95Nq7vfSBv_t-uPYH8NNJOTODIew45vnsDeT_SDh_DlM5VIYy2uGl-xabei6ELb-HboEjdQ4ZRk1ZC3HnU361Z3-FJimzoheuNkfY-YN-lvW3azapLG991TuDw7Xb6fs3WRBVYh9uqZCjb4NHcqFGkdMuW4E1UQmc2stAgvCgQAPrOq0tp54xB9BaMqnqrUETzj-TPYbdrGP4fEWZ7lNsvrqpIi987kRuD-Eid5MLIu-ATebqRe3kQujXLcg6SmJA1RSUxZRg1N4JCE-KNdlN8EjjZqKteTrSu1puxYLooJHG-f4iwh10cUWkmcP1IU8h8tDCXZav7i7x8-hgfz5eK8PP9w8ekIHkYCVwpqeQm7_bfBv0Jo0rvX44j8DrFO35E |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Power-optimal+simultaneous+buffer+insertion%2Fsizing+and+wire+sizing+for+two-pin+nets&rft.jtitle=IEEE+transactions+on+computer-aided+design+of+integrated+circuits+and+systems&rft.au=Ruiming+Li&rft.au=Dian+Zhou&rft.au=Jin+Liu&rft.au=Xuan+Zeng&rft.date=2005-12-01&rft.pub=IEEE&rft.issn=0278-0070&rft.eissn=1937-4151&rft.volume=24&rft.issue=12&rft.spage=1915&rft.epage=1924&rft_id=info:doi/10.1109%2FTCAD.2005.852672&rft.externalDocID=1542245 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0278-0070&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0278-0070&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0278-0070&client=summon |