Power-optimal simultaneous buffer insertion/sizing and wire sizing for two-pin nets

This paper studies the problems of optimizing power dissipation for simultaneous buffer insertion/sizing and uniform wire sizing (BISUWS), and simultaneous buffer insertion/sizing and tapered wire sizing (BISTWS). For BISUWS, we analyze the optimal total power dissipation under the delay constraints...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on computer-aided design of integrated circuits and systems Vol. 24; no. 12; pp. 1915 - 1924
Main Authors Li, Ruiming, Zhou, Dian, Liu, Jin, Zeng, Xuan
Format Journal Article
LanguageEnglish
Published New York IEEE 01.12.2005
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Online AccessGet full text

Cover

Loading…
Abstract This paper studies the problems of optimizing power dissipation for simultaneous buffer insertion/sizing and uniform wire sizing (BISUWS), and simultaneous buffer insertion/sizing and tapered wire sizing (BISTWS). For BISUWS, we analyze the optimal total power dissipation under the delay constraints as well as the power-delay tradeoff. For BISTWS, we study the problems of minimizing power dissipation with optimal delay constraints or with a given delay penalty. We derive optimal solutions for both cases. These solutions can be used to efficiently estimate the power dissipation for long single wires in the interconnect designs.
AbstractList This paper studies the problems of optimizing power dissipation for simultaneous buffer insertion/sizing and uniform wire sizing (BISUWS), and simultaneous buffer insertion/sizing and tapered wire sizing (BISTWS). For BISUWS, we analyze the optimal total power dissipation under the delay constraints as well as the power-delay tradeoff. For BISTWS, we study the problems of minimizing power dissipation with optimal delay constraints or with a given delay penalty. We derive optimal solutions for both cases. These solutions can be used to efficiently estimate the power dissipation for long single wires in the interconnect designs.
Author Jin Liu
Ruiming Li
Xuan Zeng
Dian Zhou
Author_xml – sequence: 1
  givenname: Ruiming
  surname: Li
  fullname: Li, Ruiming
– sequence: 2
  givenname: Dian
  surname: Zhou
  fullname: Zhou, Dian
– sequence: 3
  givenname: Jin
  surname: Liu
  fullname: Liu, Jin
– sequence: 4
  givenname: Xuan
  surname: Zeng
  fullname: Zeng, Xuan
BookMark eNqNkU1Lw0AQhhdRsK3eBS_Bg7e0s1_Z5FjqJwgK6nnZxFnZku7W3YSiv96UCIInT8PA8w4z80zJoQ8eCTmjMKcUqsXLank1ZwByXkpWKHZAJrTiKhdU0kMyAabKHEDBMZmmtAagQrJqQp6fwg5jHrad25g2S27Tt53xGPqU1b21GDPnE8bOBb9I7sv598z4t2znImY_vQ0x63Yh3zqfeezSCTmypk14-lNn5PXm-mV1lz883t6vlg95wyXr8sIai8Drwip4s7SoWS0aK6ihRholuKJMIDVFU5Y1VrVg3FZFw6CAGqCSjM_I5Th3G8NHj6nTG5cabNtxf80qKbgo_wGWoKRQcgAv_oDr0Ec_HKHLkgvOmFADBCPUxJBSRKu3cXhe_NQU9N6F3rvQexd6dDFEzseIQ8RfXIphoOTf_82G7Q
CODEN ITCSDI
CitedBy_id crossref_primary_10_3906_elk_1411_129
crossref_primary_10_3724_SP_J_1146_2010_01114
Cites_doi 10.1109/T-ED.1985.22046
10.1145/267665.267712
10.1109/TED.2002.804706
10.1109/82.673643
10.1109/DAC.1997.597214
10.1145/383251.383256
10.1016/S0167-9260(96)00008-9
10.1145/267665.267711
10.1109/ASIC.2001.954689
10.1109/EDTC.1996.494153
10.1109/43.905678
10.1109/ICCAD.1997.643579
10.1109/43.766728
10.1109/4.65707
10.1063/1.1697872
10.1109/43.97624
10.1109/ICCAD.1993.580152
10.1109/5.920581
10.1109/ICCAD.1995.480004
10.1007/978-1-4615-2325-3_3
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005
DBID 97E
RIA
RIE
AAYXX
CITATION
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
7TB
FR3
DOI 10.1109/TCAD.2005.852672
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005-present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Technology Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
Mechanical & Transportation Engineering Abstracts
Engineering Research Database
DatabaseTitle CrossRef
Technology Research Database
Computer and Information Systems Abstracts – Academic
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts Professional
Mechanical & Transportation Engineering Abstracts
Engineering Research Database
DatabaseTitleList Technology Research Database
Technology Research Database

Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1937-4151
EndPage 1924
ExternalDocumentID 2425555671
10_1109_TCAD_2005_852672
1542245
Genre orig-research
GroupedDBID --Z
-~X
0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AASAJ
ABQJQ
ABVLG
ACGFS
ACIWK
ACNCT
AENEX
AETIX
AI.
AIBXA
AKJIK
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
HZ~
H~9
IBMZZ
ICLAB
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
PZZ
RIA
RIE
RIG
RNS
TN5
VH1
VJK
XFK
AAYXX
CITATION
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
7TB
FR3
ID FETCH-LOGICAL-c352t-6fafe03b6f70df16b2b4cf41a1a5a7437124e1a6c88be9b423f96c2060b009523
IEDL.DBID RIE
ISSN 0278-0070
IngestDate Sat Aug 17 02:14:13 EDT 2024
Fri Aug 16 14:00:08 EDT 2024
Thu Oct 10 16:33:00 EDT 2024
Fri Aug 23 02:53:52 EDT 2024
Wed Jun 26 19:20:38 EDT 2024
IsPeerReviewed true
IsScholarly true
Issue 12
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c352t-6fafe03b6f70df16b2b4cf41a1a5a7437124e1a6c88be9b423f96c2060b009523
Notes ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
PQID 883432247
PQPubID 23500
PageCount 10
ParticipantIDs proquest_journals_883432247
proquest_miscellaneous_28075475
crossref_primary_10_1109_TCAD_2005_852672
proquest_miscellaneous_29543482
ieee_primary_1542245
PublicationCentury 2000
PublicationDate 2005-Dec.
2005-12-00
20051201
PublicationDateYYYYMMDD 2005-12-01
PublicationDate_xml – month: 12
  year: 2005
  text: 2005-Dec.
PublicationDecade 2000
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on computer-aided design of integrated circuits and systems
PublicationTitleAbbrev TCAD
PublicationYear 2005
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref13
ref12
ref15
ref14
nekili (ref16) 1993
ref20
ref11
ref22
ref10
ref21
ref2
(ref23) 1999
ref17
ref19
ref18
ref8
ref7
bakoglu (ref1) 1990
ref9
ref4
ref3
ref6
ref5
rabaey (ref24) 1996
References_xml – ident: ref2
  doi: 10.1109/T-ED.1985.22046
– ident: ref7
  doi: 10.1145/267665.267712
– ident: ref5
  doi: 10.1109/TED.2002.804706
– ident: ref20
  doi: 10.1109/82.673643
– year: 1990
  ident: ref1
  publication-title: Circuits Interconnections and Packaging for VLSI
  contributor:
    fullname: bakoglu
– ident: ref4
  doi: 10.1109/DAC.1997.597214
– ident: ref9
  doi: 10.1145/383251.383256
– ident: ref12
  doi: 10.1016/S0167-9260(96)00008-9
– start-page: 2023
  year: 1993
  ident: ref16
  publication-title: Proc IEEE Int Symp Circuits and Systems
  contributor:
    fullname: nekili
– ident: ref21
  doi: 10.1145/267665.267711
– ident: ref19
  doi: 10.1109/ASIC.2001.954689
– ident: ref18
  doi: 10.1109/EDTC.1996.494153
– year: 1999
  ident: ref23
  publication-title: International Technology Roadmap for Semiconductors (ITRS)
– ident: ref3
  doi: 10.1109/43.905678
– year: 1996
  ident: ref24
  publication-title: Digital Integrated Circuits A Design Perspective
  contributor:
    fullname: rabaey
– ident: ref13
  doi: 10.1109/ICCAD.1997.643579
– ident: ref8
  doi: 10.1109/43.766728
– ident: ref14
  doi: 10.1109/4.65707
– ident: ref15
  doi: 10.1063/1.1697872
– ident: ref22
  doi: 10.1109/43.97624
– ident: ref10
  doi: 10.1109/ICCAD.1993.580152
– ident: ref11
  doi: 10.1109/5.920581
– ident: ref17
  doi: 10.1109/ICCAD.1995.480004
– ident: ref6
  doi: 10.1007/978-1-4615-2325-3_3
SSID ssj0014529
Score 1.8162946
Snippet This paper studies the problems of optimizing power dissipation for simultaneous buffer insertion/sizing and uniform wire sizing (BISUWS), and simultaneous...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Publisher
StartPage 1915
SubjectTerms Application specific integrated circuits
Buffer insertion
Delay effects
Digital integrated circuits
Educational technology
Integrated circuit interconnections
Laboratories
power
Power dissipation
Research and development
simultaneous buffer insertion/sizing and wire sizing
Very large scale integration
Wire
wire sizing
Title Power-optimal simultaneous buffer insertion/sizing and wire sizing for two-pin nets
URI https://ieeexplore.ieee.org/document/1542245
https://www.proquest.com/docview/883432247
https://search.proquest.com/docview/28075475
https://search.proquest.com/docview/29543482
Volume 24
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3BTtwwEB0Bp3JoC7Tqlpb6wAUJ7yaO7cTHqipClUCVAIlbZCe2tEIkK5IIia_vTLy7UIpQb4niKM6M7Xn2zLwBOMxDUgRtC65qI7nMRODGpikPwghvEwQMNeUOn53r0yv561pdb8DxOhfGez8Gn_kpXY6-_LqtBjoqm6G5R4ujNmEzNybmaq09BuRAHM9TiDEWx_HKJZmY2SX-VDw9KZTQufjLBI01Vf5ZiEfrcvIOzlb9ikElN9Ohd9Pq4Rll4_92_D28XcJM9j2Oix3Y8M0ubD8hH9yDi99UII23uGbcYtNuTrGFtvHt0DE3UNkUNm_IV4-am3XzB3yJ2aZmRG7MlveIeFl_3_LFvGGN77sPcHXy8_LHKV-WWOAVIq-e62CDTzKnQ57UIdVOOFkFmdrUKovgIkfz71Orq6Jw3jjEXsHoSiQ6cQTORPYRtpq28Z-AOSvSzKZZXVVKZt6ZzEjcXeIUD0bVuZjA0Urq5SIyaZTjDiQxJWmICmKqMmpoAnskxMd2UX4T2F-pqVxOta4sCsqNFTKfwLf1U5wj5PiIQiuJ8UfJXL3SwlCKbSE-v_zhfXgTKVspjOULbPV3g_-KYKR3B-Mo_AMHaNxG
link.rule.ids 315,783,787,799,27936,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Nb9QwEB2VcoAeWqAglgLNgQsS3k0c27GPFWq1QLdCYiv1FtmJLa0qkookqtRfz0y8u3wKcUsUR3FmbM-zZ-YNwJsipDooq5msjWAi54EZm2UscMO9TREw1JQ7vLhQ80vx8Upe7cC7bS6M934MPvNTuhx9-XVbDXRUNkNzjxZH3oP7iKu1itlaW58BuRDHExXijMWRvHFKpma2xN-K5ydaclXwX4zQWFXlj6V4tC9nB7DY9CyGlVxPh95Nq7vfSBv_t-uPYH8NNJOTODIew45vnsDeT_SDh_DlM5VIYy2uGl-xabei6ELb-HboEjdQ4ZRk1ZC3HnU361Z3-FJimzoheuNkfY-YN-lvW3azapLG991TuDw7Xb6fs3WRBVYh9uqZCjb4NHcqFGkdMuW4E1UQmc2stAgvCgQAPrOq0tp54xB9BaMqnqrUETzj-TPYbdrGP4fEWZ7lNsvrqpIi987kRuD-Eid5MLIu-ATebqRe3kQujXLcg6SmJA1RSUxZRg1N4JCE-KNdlN8EjjZqKteTrSu1puxYLooJHG-f4iwh10cUWkmcP1IU8h8tDCXZav7i7x8-hgfz5eK8PP9w8ekIHkYCVwpqeQm7_bfBv0Jo0rvX44j8DrFO35E
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Power-optimal+simultaneous+buffer+insertion%2Fsizing+and+wire+sizing+for+two-pin+nets&rft.jtitle=IEEE+transactions+on+computer-aided+design+of+integrated+circuits+and+systems&rft.au=Ruiming+Li&rft.au=Dian+Zhou&rft.au=Jin+Liu&rft.au=Xuan+Zeng&rft.date=2005-12-01&rft.pub=IEEE&rft.issn=0278-0070&rft.eissn=1937-4151&rft.volume=24&rft.issue=12&rft.spage=1915&rft.epage=1924&rft_id=info:doi/10.1109%2FTCAD.2005.852672&rft.externalDocID=1542245
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0278-0070&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0278-0070&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0278-0070&client=summon