A Lightweight One-Stage Defect Detection Network for Small Object Based on Dual Attention Mechanism and PAFPN

• Published in: Frontiers in physics Vol. 9
• Main Authors: Zhang, Yue, Xie, Fei, Huang, Lei, Shi, Jianjun, Yang, Jiale, Li, Zongan
• Format: Journal Article
• Language: English
• Published: Frontiers Media S.A 06.10.2021
• Subjects: bounding box regression loss function; deep learning; defect detection; dual attention mechanism; PAFPN

Normally functioning and complete printed circuit board (PCB) can ensure the safety and reliability of electronic equipment. PCB defect detection is extremely important in the field of industrial inspection. For traditional methods of PCB inspection, such as contact detection, are likely to damage t...