Characterization of deep acceptor level in as-grown ZnO thin film by molecular beam epitaxy
We report deep level transient spectroscopy results from ZnO layers grown on silicon by molecular beam epitaxy (MBE), The hot probe measurements reveal mixed conductivity in the as-grown ZnO layers, and the current-voltage (l-V) measurements demonstrate a good quality p-type Schottky device. A new d...
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Published in | Chinese physics B Vol. 23; no. 9; pp. 364 - 368 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
01.09.2014
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Subjects | |
Online Access | Get full text |
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Summary: | We report deep level transient spectroscopy results from ZnO layers grown on silicon by molecular beam epitaxy (MBE), The hot probe measurements reveal mixed conductivity in the as-grown ZnO layers, and the current-voltage (l-V) measurements demonstrate a good quality p-type Schottky device. A new deep acceptor level is observed in the ZnO layer having activation energy of 0.49 ± 0.03 eV and capture cross-section of 8,57 ×10^-18 cm^2. Based on the results from Raman spectroscopy, photoluminescence, and secondary ion mass spectroscopy (SIMS) of the ZnO layer, the observed acceptor trap level is tentatively attributed to a nitrogen-zinc vacancy complex in ZnO, |
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Bibliography: | ZnO, secondary ion mass spectroscopy, photoluminescence, Raman spectroscopy M. Asghar, K. Mahmood, M. A. Hasan, I. T. Ferguson, R. Tsu, M. WiUander(1.Department of Physics, The Islamia University of Bahawalpur, Bahawalpur, 63100, Pakistan; 2. Department of Electrical and Computer Engineering, University of North Carolina Charlotte, NC 28223, USA; 2. Department of Science and Technology, Link6ping University Norrkoping, Sweden) We report deep level transient spectroscopy results from ZnO layers grown on silicon by molecular beam epitaxy (MBE), The hot probe measurements reveal mixed conductivity in the as-grown ZnO layers, and the current-voltage (l-V) measurements demonstrate a good quality p-type Schottky device. A new deep acceptor level is observed in the ZnO layer having activation energy of 0.49 ± 0.03 eV and capture cross-section of 8,57 ×10^-18 cm^2. Based on the results from Raman spectroscopy, photoluminescence, and secondary ion mass spectroscopy (SIMS) of the ZnO layer, the observed acceptor trap level is tentatively attributed to a nitrogen-zinc vacancy complex in ZnO 11-5639/O4 ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 1674-1056 2058-3834 1741-4199 |
DOI: | 10.1088/1674-1056/23/9/097101 |