Cluster secondary ion emission of silicon: An influence of the samples' dimensional features

• Published in: Rapid communications in mass spectrometry Vol. 33; no. 3; pp. 323 - 325
• Main Authors: Tolstogouzov, Alexander, Drozdov, Mikhail N., Belykh, Sergey F., Gololobov, Gennady P., Ieshkin, Alexei E., Mazarov, Paul, Suvorov, Dmitriy V., Fu, Dejun, Pelenovich, Vasiliy, Zeng, Xiaomei, Zuo, Wenbin
• Format: Journal Article
• Language: English
• Published: England Wiley Subscription Services, Inc 15.02.2019
• Subjects: Ion emission; Secondary ion emission