Cluster secondary ion emission of silicon: An influence of the samples' dimensional features

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Bibliographic Details
Published inRapid communications in mass spectrometry Vol. 33; no. 3; pp. 323 - 325
Main Authors Tolstogouzov, Alexander, Drozdov, Mikhail N., Belykh, Sergey F., Gololobov, Gennady P., Ieshkin, Alexei E., Mazarov, Paul, Suvorov, Dmitriy V., Fu, Dejun, Pelenovich, Vasiliy, Zeng, Xiaomei, Zuo, Wenbin
Format Journal Article
LanguageEnglish
Published England Wiley Subscription Services, Inc 15.02.2019
Subjects
Ion emission
Secondary ion emission
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Bibliography:SourceType-Other Sources-1
content type line 63
ObjectType-Correspondence-1
ISSN:0951-4198
1097-0231
DOI:10.1002/rcm.8345