Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale

• Published in: Advanced Physics Research Vol. 3; no. 7
• Main Authors: McCluskey, Conor J., Sharma, Niyorjyoti, Maguire, Jesi R., Pauly, Serene, Rogers, Andrew, Lindsay, TJ, Holsgrove, Kristina M., Rodriguez, Brian J., Soin, Navneet, Gregg, John Marty, McQuaid, Raymond G. P., Kumar, Amit
• Format: Journal Article
• Language: English
• Published: Edinburgh John Wiley & Sons, Inc 01.07.2024; Wiley-VCH
• Subjects: Bias; Electrical phenomena; Electrodes; Ferroelectrics; Fluoropolymers; High voltage; High voltages; high‐voltage KPFM; Microscopy; Positive temperature coefficient; Potential gradient; potential mapping; pyroelectrics; Semiconductors; Topography; triboelectric

Kelvin probe force microscopy (KPFM) is a well‐established scanning probe technique, used to measure surface potential accurately; it has found extensive use in the study of a range of materials phenomena. In its conventional form, KPFM frustratingly precludes imaging samples or scenarios where larg...