Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale - McCluskey, Conor J.; Sharma, Niyorjyoti; Maguire, Jesi R.; Pauly, Serene; Rogers, Andrew; Lindsay, TJ; Holsgrove, Kristina M.; Rodriguez, Brian J.; Soin, Navneet; Gregg, John Marty; McQuaid, Raymond G. P.; Kumar, Amit (Advanced Physics Research, 2024)
Keywords: Bias; Electrical phenomena; Electrodes; Ferroelectrics; Fluoropolymers; High voltage; High voltages; high‐voltage KPFM; Microscopy; Positive temperature coefficient; Potential gradient; potential mapping; pyroelectrics; Semiconductors; Topography; triboelectric