Priori information analysis of optocoupler accelerated degradation experiment based on failure mechanism verification test

The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions. It is necessary to use accelerated storage test to verify the storage life of long storage products. Especially for small sample products, it is very important to obtain prior information for the design...

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Published inDefence technology Vol. 16; no. 2; pp. 392 - 400
Main Authors Zhang, Xuan-gong, Mu, Xi-hui, Feng, Jing, Li, Hui-zhi
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.04.2020
Department of Ammunition Engineering, Army Engineering University Shijiazhuang Campus, Shijiazhuang, 050000, China%Hunan Ginkgo Data Technology Co., Ltd., Luositang Road, Changsha, Hunan, 410100, China
KeAi Communications Co., Ltd
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Online AccessGet full text
ISSN2214-9147
2214-9147
DOI10.1016/j.dt.2019.06.011

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Abstract The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions. It is necessary to use accelerated storage test to verify the storage life of long storage products. Especially for small sample products, it is very important to obtain prior information for the design and implementation of accelerated degradation test. In this paper, the optocoupler failure mechanism verification test is designed and the experimental results are analyzed and the prior information is obtained. The results show that optocouplers have two failure modes, one is sudden failure and the other is degradation failure; the maximum temperature stress of optocoupler can't exceed 140 °C; the increase of leakage current of optocoupler is caused by movable ions contaminating the LED chip. The surface leakage current is proportional to the adsorption amount. The increase of leakage current makes p-n junction tunneling effect occur which LEDs the failure of the optocoupler. The lifetime distribution model of the optocoupler is determined by the failure physics. The lifetime of the optocoupler is subject to the lognormal distribution. The degeneracy orbit of the optocoupler leakage current is described by a power law model. The estimated values of the orbital parameters are initially calculated and the parameters of its life distribution function are deduced. The above information lays a good foundation for the optimization design and data processing of the accelerated degradation experiment.
AbstractList The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions. It is necessary to use accelerated storage test to verify the storage life of long storage products. Especially for small sample products, it is very important to obtain prior information for the design and implementation of accelerated degradation test. In this paper, the optocoupler failure mechanism verification test is designed and the experimental results are analyzed and the prior information is obtained. The results show that optocouplers have two failure modes, one is sudden failure and the other is degradation failure; the maximum temperature stress of optocoupler can't exceed 140 °C; the increase of leakage current of optocoupler is caused by movable ions contaminating the LED chip. The surface leakage current is proportional to the adsorption amount. The increase of leakage current makes p-n junction tunneling effect occur which LEDs the failure of the optocoupler. The lifetime distribution model of the optocoupler is determined by the failure physics. The lifetime of the optocoupler is subject to the lognormal distribution. The degeneracy orbit of the optocoupler leakage current is described by a power law model. The estimated values of the orbital parameters are initially calculated and the parameters of its life distribution function are deduced. The above information lays a good foundation for the optimization design and data processing of the accelerated degradation experiment.
The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions. It is necessary to use accelerated storage test to verify the storage life of long storage products. Especially for small sample products, it is very important to obtain prior information for the design and imple-mentation of accelerated degradation test. In this paper, the optocoupler failure mechanism verification test is designed and the experimental results are analyzed and the prior information is obtained. The results show that optocouplers have two failure modes, one is sudden failure and the other is degra-dation failure; the maximum temperature stress of optocoupler can't exceed 140℃C; the increase of leakage current of optocoupler is caused by movable ions contaminating the LED chip. The surface leakage current is proportional to the adsorption amount. The increase of leakage current makes p-n junction tunneling effect occur which LEDs the failure of the optocoupler. The lifetime distribution model of the optocoupler is determined by the failure physics. The lifetime of the optocoupler is subject to the lognormal distribution. The degeneracy orbit of the optocoupler leakage current is described by a power law model. The estimated values of the orbital parameters are initially calculated and the parameters of its life distribution function are deduced. The above information lays a good foundation for the opti-mization design and data processing of the accelerated degradation experiment.
Author Li, Hui-zhi
Mu, Xi-hui
Zhang, Xuan-gong
Feng, Jing
AuthorAffiliation Department of Ammunition Engineering, Army Engineering University Shijiazhuang Campus, Shijiazhuang, 050000, China%Hunan Ginkgo Data Technology Co., Ltd., Luositang Road, Changsha, Hunan, 410100, China
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Keywords Failure mechanism
Accelerated degradation
Failure mechanism verification test
Priori information
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Snippet The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions. It is necessary to use accelerated storage test to verify the...
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StartPage 392
SubjectTerms Accelerated degradation
Failure mechanism
Failure mechanism verification test
Priori information
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Title Priori information analysis of optocoupler accelerated degradation experiment based on failure mechanism verification test
URI https://dx.doi.org/10.1016/j.dt.2019.06.011
https://d.wanfangdata.com.cn/periodical/bgxb-e202002015
https://doaj.org/article/3cd0379ac51d47f98e54f21119bab55a
Volume 16
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