Anisotropic Scale-Invariant Ellipse Detection

• Published in: IEEE transactions on image processing Vol. 33; p. 1
• Main Authors: Wang, Zikai, Zhong, Baojiang, Ma, Kai-Kuang
• Format: Journal Article
• Language: English
• Published: United States IEEE 01.01.2024; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Accuracy; Aerospace electronics; Algorithms; Anisotropic; Anisotropic magnetoresistance; Anisotropic scale-invariant; Anisotropy; Detectors; distance measure; ellipse fitting; Elliptic fitting; Ellipticity; Extraterrestrial measurements; Fitting; homologous similarity; Image analysis; Image edge detection; Invariants; least squares; Pharmacists

Detecting ellipses poses a challenging low-level task indispensable to many image analysis applications. Existing ellipse detection methods commonly encounter two fundamental issues. First, inferior detection accuracy could be incurred on a small ellipse than that on a large one; this introduces the...