Conductive atomic force microscopy on carbon nanowalls

• Published in: Journal of non-crystalline solids Vol. 358; no. 17; pp. 2545 - 2547
• Main Authors: Vetushka, A., Itoh, T., Nakanishi, Y., Fejfar, A., Nonomura, S., Ledinský, M., Kočka, J.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Oxford Elsevier B.V 01.09.2012; Elsevier
• Subjects: Applied sciences; Carbon nanowalls; Condensed matter: structure, mechanical and thermal properties; Conductive atomic force microscopy; Cross-disciplinary physics: materials science; rheology; Electronics; Exact sciences and technology; Materials science; Micro- and nanoelectromechanical devices (mems/nems); Nanoscale materials and structures: fabrication and characterization; Nanostructures; Nanotubes; Physical properties of thin films, nonelectronic; Physics; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Torsion resonance mode; Torsion resonance mode; Conductive atomic force microscopy; Carbon nanowalls; Nanostructures; Atomic force microscopy; Electrical conductivity; Carbon nanotubes; Oscillations; Cantilever beam; Fine structure; Feedback; Imaging; Resonance; Nanostructured materials; Nanowall; Non contact measurement
• ISSN: 0022-3093; 1873-4812
• DOI: 10.1016/j.jnoncrysol.2011.12.094

The nanostructure of carbon nanowalls (CNWs) was investigated by Torsion Resonance (TR) Atomic Force Microscopy (AFM). In this dynamic non-contact imaging mode a cantilever oscillates torsionally and the amplitude of oscillations is used for the AFM feedback. The technique includes benefits of the semicontact (tapping) mode and at the same time allows one to measure the local conductivity. Moreover, the phase signal is much stronger and fine structures of the CNWs were observed. We also present a comparison of the results obtained by TR, tapping, and contact modes. ► Carbon nanowalls were investigated by Torsion Resonance Atomic Force Microscopy. ► Cantilever oscillates in a close proximity of sample surface (~1–2nm). ► Local conductivity was measured simultaneously with topography. ► High conductivity on top of the nanowalls was measured. ► The phase signal revealed fine structure of the edges of CNW.