Assessing the width of Gaussian density of states in organic semiconductors

• Published in: Organic electronics Vol. 17; pp. 304 - 318
• Main Authors: Maddalena, Francesco, de Falco, Carlo, Caironi, Mario, Natali, Dario
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.02.2015
• Subjects: Capacitance–Voltage measurement; Density of states; Metal–insulator–semiconductor; Organic semiconductor; Organic thin film transistor; Metal–insulator–semiconductor; Density of states; Capacitance–Voltage measurement; Organic thin film transistor; Organic semiconductor

[Display omitted] •The DOS width is assessed using MIS capacitors as test beds.•The DOS width is assessed without involving carrier mobility.•The approach is based on numerical fitting of Capacitance–Voltage curves.•Two semiconducting polymers, one of n-type and one of p-type are analyzed.•Extracted...