Arc-Support Line Segments Revisited: An Efficient High-Quality Ellipse Detection

• Published in: IEEE transactions on image processing Vol. 29; pp. 768 - 781
• Main Authors: Lu, Changsheng, Xia, Siyu, Shao, Ming, Fu, Yun
• Format: Journal Article
• Language: English
• Published: United States IEEE 01.01.2020; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Algorithms; arc-support line segment; Automation; Cluster analysis; Clustering; Convexity; Detection algorithms; Detectors; Ellipse detection; ellipse fitting; Ellipses; Image detection; Image edge detection; Image segmentation; Merging; Polarity; polarity analysis; Segments; Source code; Transforms

Over the years many ellipse detection algorithms spring up and are studied broadly, while the critical issue of detecting ellipses accurately and efficiently in real-world images remains a challenge. In this paper, we propose a valuable industry-oriented ellipse detector by arc-support line segments...