Arc-Support Line Segments Revisited: An Efficient High-Quality Ellipse Detection - Lu, Changsheng; Xia, Siyu; Shao, Ming; Fu, Yun (IEEE transactions on image processing, 2020)
Keywords: Algorithms; arc-support line segment; Automation; Cluster analysis; Clustering; Convexity; Detection algorithms; Detectors; Ellipse detection; ellipse fitting; Ellipses; Image detection; Image edge detection; Image segmentation; Merging; Polarity; polarity analysis; Segments; Source code; Transforms