Cross-Batch Hard Example Mining With Pseudo Large Batch for ID vs. Spot Face Recognition - Tan, Zichang; Liu, Ajian; Wan, Jun; Liu, Hao; Lei, Zhen; Guo, Guodong; Li, Stan Z. (IEEE transactions on image processing, 2022)
Keywords: Algorithms; Benchmarking; Biometric Identification - methods; cross-batch hard example mining; Datasets; Deep learning; Face - anatomy & histology; Face - diagnostic imaging; Face recognition; Facial Recognition; Feature extraction; Graphics processing units; Humans; ID vs spot; Logic gates; Measurement; Object recognition; pseudo large batch; Training; Verification