Deflection gating for time-resolved x-ray magnetic circular dichroism–photoemission electron microscopy using synchrotron radiation

In this paper, we present a newly developed gating technique for a time-resolving photoemission microscope. The technique makes use of an electrostatic deflector within the microscope's electron optical system for fast switching between two electron-optical paths, one of which is used for imagi...

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Bibliographic Details
Published inReview of scientific instruments Vol. 83; no. 6; p. 063706
Main Authors Wiemann, C., Kaiser, A. M., Cramm, S., Schneider, C. M.
Format Journal Article
LanguageEnglish
Published United States 01.06.2012
Subjects
BESSY STORAGE RING
Blocking
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Deflection
ELECTRO-OPTICAL EFFECTS
ELECTRON MICROSCOPY
Gating and risering
INJECTION
MAGNETIC CIRCULAR DICHROISM
MICROSCOPES
OPTICAL SYSTEMS
PHOTOEMISSION
Rejection
Switching
SYNCHROTRON RADIATION
SYNCHROTRON RADIATION SOURCES
TIME RESOLUTION
X RADIATION
X-rays
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Summary:In this paper, we present a newly developed gating technique for a time-resolving photoemission microscope. The technique makes use of an electrostatic deflector within the microscope's electron optical system for fast switching between two electron-optical paths, one of which is used for imaging, while the other is blocked by an aperture stop. The system can be operated with a switching time of 20 ns and shows superior dark current rejection. We report on the application of this new gating technique to exploit the time structure in the injection bunch pattern of the synchrotron radiation source BESSY II at Helmholtz-Zentrum Berlin for time-resolved measurements in the picosecond regime.
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ISSN:0034-6748
1089-7623
1089-7623
DOI:10.1063/1.4729603