Wiemann, C., Kaiser, A. M., Cramm, S., & Schneider, C. M. (2012). Deflection gating for time-resolved x-ray magnetic circular dichroism–photoemission electron microscopy using synchrotron radiation. Review of scientific instruments, 83(6), 063706. https://doi.org/10.1063/1.4729603
Chicago Style (17th ed.) CitationWiemann, C., A. M. Kaiser, S. Cramm, and C. M. Schneider. "Deflection Gating for Time-resolved X-ray Magnetic Circular Dichroism–photoemission Electron Microscopy Using Synchrotron Radiation." Review of Scientific Instruments 83, no. 6 (2012): 063706. https://doi.org/10.1063/1.4729603.
MLA (9th ed.) CitationWiemann, C., et al. "Deflection Gating for Time-resolved X-ray Magnetic Circular Dichroism–photoemission Electron Microscopy Using Synchrotron Radiation." Review of Scientific Instruments, vol. 83, no. 6, 2012, p. 063706, https://doi.org/10.1063/1.4729603.