Early Stages of Passive Film Formation on Chromium Studied by Three‐Parameter Ellipsometry

Chromium is an important component of numerous corrosion-resistant alloys, whose effective resistance against corrosion is due to the existence of a passive film that is enriched in chromium. Therefore, the mechanism of passive film formation on chromium and the properties and thickness of the film...

Full description

Saved in:
Bibliographic Details
Published inJournal of the Electrochemical Society Vol. 144; no. 5; pp. 1581 - 1585
Main Authors Kim, Changwook, Paik, Woon‐kie
Format Journal Article
LanguageEnglish
Published Pennington, NJ Electrochemical Society 01.05.1997
Subjects
Online AccessGet full text

Cover

Loading…
Abstract Chromium is an important component of numerous corrosion-resistant alloys, whose effective resistance against corrosion is due to the existence of a passive film that is enriched in chromium. Therefore, the mechanism of passive film formation on chromium and the properties and thickness of the film have been the subject of numerous studies. The studies were made by various methods including electrochemical methods, Auger spectroscopy, surface-enhanced Raman spectroscopy, and x-ray photoelectron spectroscopy (XPS) in conjunction with electrochemical experiments. The usual (two-parameter) ellipsometry has also been used to study the passive film on chromium. In this study, passive film formation on a chromium surface was studied by three-parameter ellipsometry as the film was formed by anodic polarization in citrate buffer solutions. The thickness and the optical constants of the film were obtained from automatic measurements as functions of time of anodic polarization, from subsecond to 60 s range. The thickness of the passive film increased rapidly within a few seconds, during which both the real and imaginary parts of the complex refractive index of the film changed. These film properties approached near stationary-state values after about 20 s. The stationary- state film thickness increased linearly with the potential of the chromium electrode and depended on pH of the electrolyte, whereas the optical constants did not show significant dependence on these factors. The passive film appeared to be a homogeneous single near-dielectric film, possibly of a composition close to Cr2O3. No indication of a transformation of the film was observed during the early stages of passivation. 6 figs., tab. of thickness and refractive index of films, 17 refs.
AbstractList Chromium is an important component of numerous corrosion-resistant alloys, whose effective resistance against corrosion is due to the existence of a passive film that is enriched in chromium. Therefore, the mechanism of passive film formation on chromium and the properties and thickness of the film have been the subject of numerous studies. The studies were made by various methods including electrochemical methods, Auger spectroscopy, surface-enhanced Raman spectroscopy, and x-ray photoelectron spectroscopy (XPS) in conjunction with electrochemical experiments. The usual (two-parameter) ellipsometry has also been used to study the passive film on chromium. In this study, passive film formation on a chromium surface was studied by three-parameter ellipsometry as the film was formed by anodic polarization in citrate buffer solutions. The thickness and the optical constants of the film were obtained from automatic measurements as functions of time of anodic polarization, from subsecond to 60 s range. The thickness of the passive film increased rapidly within a few seconds, during which both the real and imaginary parts of the complex refractive index of the film changed. These film properties approached near stationary-state values after about 20 s. The stationary- state film thickness increased linearly with the potential of the chromium electrode and depended on pH of the electrolyte, whereas the optical constants did not show significant dependence on these factors. The passive film appeared to be a homogeneous single near-dielectric film, possibly of a composition close to Cr2O3. No indication of a transformation of the film was observed during the early stages of passivation. 6 figs., tab. of thickness and refractive index of films, 17 refs.
Passive film formation on a chromium surface was studied by three-parameter ellipsometry as the film was formed by anodic polarization in citrate buffer solutions. The thickness and the optical constants of the film were obtained from automatic measurements as functions of time of anodic polarization, from subsecond to 60 s range. The thickness of the passive film increased rapidly within a few seconds, during which both the real and imaginary parts of the complex refractive index of the film changed. These film properties approached near stationary-state values after about 20 s. The stationary-state film thickness increased linearly with the potential of the chromium electrode and depended on pH of the electrolyte, whereas the optical constants did not show signficant dependence on these factors. The passive film appeared to be a homogeneous single near-dielectric film, possibly of a composition close to Cr sub 2 O sub 3 . No indication of a transformation of the film was observed during the early stages of passivation.
Author Paik, Woon‐kie
Kim, Changwook
Author_xml – sequence: 1
  givenname: Changwook
  surname: Kim
  fullname: Kim, Changwook
  organization: Department of Chemistry, Sogang University, Seoul 121‐742, Korea
– sequence: 2
  givenname: Woon‐kie
  surname: Paik
  fullname: Paik, Woon‐kie
  organization: Department of Chemistry, Sogang University, Seoul 121‐742, Korea
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=2696267$$DView record in Pascal Francis
BookMark eNp90cFq3DAQAFBRUuhmm0P_QIcS2oMTjSRL9rEsu21hoYGmt4AZ26NGQbY2kjewt35Cv7FfUqdZciilMDAMvJmBmVN2MsaRGHsD4gJA15dwAZWyRusXbAG1LgsLACdsIQSoQpsSXrHTnO_mEiptF-xmjSkc-NcJv1Pm0fErzNk_EN_4MPBNTANOPo58jtVtioPfDzPe95563h749W0i-vXj5xUmHGiixNch-F2Oc5EOr9lLhyHT2TEv2bfN-nr1qdh--fh59WFbdEqbqdDKtNK0ZKq-tW1v-7p2UnS26gUK1NTWEo1T1BsqnZAEVCsnbOUsVah6q5bs_GnuLsX7PeWpGXzuKAQcKe5zI62SpZkvsGTv_gvBVFUJtQQ107dHirnD4BKOnc_NLvkB06GRpjbSPK5-_8S6FHNO5J4FiObxIw00x4_M9vIv2_npz3mnhD78o-M3XPiPxQ
CODEN JESOAN
CitedBy_id crossref_primary_10_1080_00202967_1998_11871232
ContentType Journal Article
Copyright 1997 INIST-CNRS
Copyright_xml – notice: 1997 INIST-CNRS
DBID AAYXX
CITATION
IQODW
7SE
8FD
JG9
8BQ
DOI 10.1149/1.1837644
DatabaseName CrossRef
Pascal-Francis
Corrosion Abstracts
Technology Research Database
Materials Research Database
METADEX
DatabaseTitle CrossRef
Materials Research Database
Technology Research Database
Corrosion Abstracts
METADEX
DatabaseTitleList Materials Research Database
Materials Research Database
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Chemistry
Applied Sciences
EISSN 1945-7111
EndPage 1585
ExternalDocumentID 2696267
10_1149_1_1837644
GroupedDBID -~X
.-4
.DC
0R~
29L
5GY
6TJ
9M8
AATNI
AAYXX
ABDNZ
ABEFU
ABJNI
ACBEA
ACHIP
ADEQX
ADNWM
AENEX
AI.
AKPSB
ALMA_UNASSIGNED_HOLDINGS
AOAED
CITATION
CJUJL
CS3
DU5
F5P
H~9
IOP
IZVLO
JGOPE
KOT
MV1
MVM
N5L
NHB
REC
RHI
RNS
ROL
RPA
TAE
TN5
UPT
VH1
VOH
VQP
WH7
XOL
YQT
ZY4
~02
41~
ACYGS
EBS
EJD
H13
IQODW
NFQFE
XJT
YXB
7SE
8FD
JG9
8BQ
ID FETCH-LOGICAL-c346t-436b26be68db7bd7d99f20c78d0a0a4eb92a6f3ed6e5f02e1e93f078f7e8a3d73
ISSN 0013-4651
IngestDate Fri Jul 11 05:58:40 EDT 2025
Thu Jul 10 18:45:39 EDT 2025
Mon Jul 21 09:15:31 EDT 2025
Tue Jul 01 04:28:03 EDT 2025
Thu Apr 24 23:09:57 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 5
Keywords Optical constant
Surface layer
Refraction index
Citrate
Buffer solution
Layer thickness
Passivity
Ellipsometry
Chromium
pH
Anodic polarization
Electrode potential
Passivation
Language English
License https://iopscience.iop.org/page/copyright
https://iopscience.iop.org/info/page/text-and-data-mining
CC BY 4.0
LinkModel OpenURL
MergedId FETCHMERGED-LOGICAL-c346t-436b26be68db7bd7d99f20c78d0a0a4eb92a6f3ed6e5f02e1e93f078f7e8a3d73
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ObjectType-Article-2
ObjectType-Feature-1
PQID 1688519213
PQPubID 23500
PageCount 5
ParticipantIDs proquest_miscellaneous_27325601
proquest_miscellaneous_1688519213
pascalfrancis_primary_2696267
crossref_primary_10_1149_1_1837644
crossref_citationtrail_10_1149_1_1837644
ProviderPackageCode CITATION
AAYXX
PublicationCentury 1900
PublicationDate 1997-05-01
PublicationDateYYYYMMDD 1997-05-01
PublicationDate_xml – month: 05
  year: 1997
  text: 1997-05-01
  day: 01
PublicationDecade 1990
PublicationPlace Pennington, NJ
PublicationPlace_xml – name: Pennington, NJ
PublicationTitle Journal of the Electrochemical Society
PublicationYear 1997
Publisher Electrochemical Society
Publisher_xml – name: Electrochemical Society
SSID ssj0011847
Score 1.5503768
Snippet Chromium is an important component of numerous corrosion-resistant alloys, whose effective resistance against corrosion is due to the existence of a passive...
Passive film formation on a chromium surface was studied by three-parameter ellipsometry as the film was formed by anodic polarization in citrate buffer...
SourceID proquest
pascalfrancis
crossref
SourceType Aggregation Database
Index Database
Enrichment Source
StartPage 1581
SubjectTerms Applied sciences
Corrosion
Corrosion environments
Exact sciences and technology
Metals. Metallurgy
Title Early Stages of Passive Film Formation on Chromium Studied by Three‐Parameter Ellipsometry
URI https://www.proquest.com/docview/1688519213
https://www.proquest.com/docview/27325601
Volume 144
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3fb9MwELZgPABCCAYTBQYG8YCEMuLYsevHaeo00Nj20EoVL1Ec26xiaabRPsBfzzm202YU8UOqoiY6nar73MvnH_cdQm_gDyZZxfLEWKUTRjKSKFOyhEI-duoiQ92WR3864UcT9nGaT1ct_drqkoXaq35srCv5H1ThGeDqqmT_AdnOKTyA74AvXAFhuP4Vxl6dGPjdFy8dewlMuJXxnl3Uq7JEtx9QnV819WxZt3KykXUCjCZx2t-1OxPzzrTbAg3c9Muk1zirY6kj3zinikoD4dznajO_7i2-npWzr91BPr--4LVZ42m-mDMJTVzH9F7O9KKNYXDkaxmQ5L4FS3ibwm2-OVMzJ3RK9iClCB689dSwT06Lw8nxcTEeTcc30a0MpgGuQ8WH07NulwhmpyJ2qHC_MChHgev3neMe37gHOEBkrO9Z8svrt-UU4wfofggs3vfIPkQ3zHwb3T6IPfi20d01uchH6HOLN_Z448bigDd2eOMObwyfiDcOeGP1HV_DG6_j_RhNDkfjg6Mk9MZIKsr4ImGUq4wrw4daCaWFltJmaSWGOi3Tkhkls5JbajQ3uU0zQ4ykFuigFWZYUi3oDtqaN3PzBGFDrJXgIpMQT2JTmBEYpgWxTuqNZGqA3sYIFlUQjnf9Sy4KX9QuC1KEYA_Q68700qulbDLa7cHQWWZcwvRaDNCrCEsB4XYbWOXcNMtvBYHckTsBPzpAL39jA3S8XWV4-keLZ-jOarw_R1uLq6XZBYa5UC_aYfYT-JyAag
linkProvider IOP Publishing
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Early+stages+of+passive+film+formation+on+chromium+studied+by+three-parameter+ellipsometry&rft.jtitle=Journal+of+the+Electrochemical+Society&rft.au=Kim%2C+C&rft.au=Paik%2C+W&rft.date=1997-05-01&rft.issn=0013-4651&rft.volume=144&rft.issue=5&rft.spage=1581&rft.epage=1585&rft_id=info:doi/10.1149%2F1.1837644&rft.externalDBID=NO_FULL_TEXT
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0013-4651&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0013-4651&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0013-4651&client=summon