The influence of interface modifier on photodetachment of negative ions in an electric field near a metal surface

• Published in: Chinese physics B Vol. 20; no. 7; pp. 133 - 141
• Main Author: 黄凯云 王德华
• Format: Journal Article
• Language: English
• Published: 01.07.2011
• Subjects: Coherence; Electric fields; Holes; Metal surfaces; Negative ions; Orbits; Oscillations; Photodetachment; 光致; 电场方向; 界面强化; 界面改性剂; 能量范围; 负离子; 金属表面; 闭合轨道理论
• ISSN: 1674-1056; 2058-3834
• DOI: 10.1088/1674-1056/20/7/073201

Based on closed-orbit theory, the influence of an interface modifier on the photodetachment of H^- in an electric field near a metal surface is studied. It is demonstrated that the interface strengthens the oscillations in the photodetachment cross section. However, when the electric field environments are different, the strengthening oscillations are caused by different sources. When the electric field direction is upward, the interface enhances the oscillations by shortening the period and the action of the closed orbit. When the electric field direction is downward, the interface strengthens the oscillations either by extending the coherent energy range or by increasing the total number of the closed orbits. We hope that our results will be conducive to the understanding of the photodetachment process of negative ions near interfaces, cavities and ion traps.