Optical and dielectric results of Y0.225Sr0.775CoO3±δ thin films studied by spectroscopic ellipsometry technique

• Published in: Results in physics Vol. 3; pp. 167 - 172
• Main Authors: Ali, A.I., Son, J.Y., Ammar, A.H., Abdel Moez, A., Kim, Y.S.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 2013
• Subjects: Effective mass; Ellipsometer; Optical properties; Oscillating energyand dielectric properties; Thin films were prepared by PLD; Y0.225Sr0.775CoO3±δ; Thin films were prepared by PLD; Y0.225Sr0.775CoO3±δ; Effective mass; Ellipsometer; Oscillating energyand dielectric properties; Optical properties

Y0.225Sr0.775CoO3±δ thin films have been deposited on SrTiO3 (111), SrTiO3 (100), LaAlO3 (100) and MgO (111) single crystals substrates at 500°C by pulsed laser deposition (PLD) method. The optical measurements of these films were studied by ellipsometric method in the spectral range from 310 to 124...